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    The electronics industry continues to grow and make technical advancements. Researchers at Frost & Sullivan, a global consulting firm, have identified several growth areas, among them communication technology test equipment, components for aerospace uses and others.

 

Communication technology

    The phenomenal growth in the number of next-generation communication technologies since 2002 has generated a parallel demand for local area network/wireless area network (LAN/WAN) test equipment.

    Sophisticated technologies such as Gigabit Ethernet (GbE), 10 GbE and voice over Internet Protocol (VoIP) have created lucrative markets for LAN/WAN test equipment vendors.

    New analysis from Frost & Sullivan reveals that revenues in these markets totaled $731.8 million in 2004 and projects to reach $1,155.6 million in 2011.

    GbE provides a data rate of 1,000Mbits/sec through optical fibers and its upgraded versions are 10 GbE and 40 GbE. Ten GbE is the most lucrative technology in the LAN/WAN test equipment markets. Vendors that can provide this solution will see tremendous growth rates.

    The extraordinary benefits these technologies provide come with several associated deployment complications such as the number of servers the networks supporting and covering it.

    While it is difficult to sort out the issues concerning all these new technologies, they also boost demand for the LAN/WAN test equipment market. LAN/WAN vendors have to take advantage of the novelty of these technologies, as their test equipment will not be available in the gray market just yet.

  “Even with such a remarkable market growth, demand for traditional protocols is declining,” say Frost & Sullivan Research Analysts Sujan Sami and Ayshwarya Deepak. “Most vendors are combining protocol analyzers with performance analyzers and creating a single solution.”

    The constant need to upgrade and expand the existing networks has countered this decline in the demand for traditional protocol analyzers, boosting revenues in the LAN/WAN test...

 

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